举办地点：腾讯会议734 637 409
主办单位：统计学院 国际交流与合作处 科研处
Dr. Li is Professor with the Department of Industrial Engineering and Engineering Management at Western New England University. He currently serves on the editorial board for IEEE Transactions on Reliability and the lead editor of IEEE Access Reliability Society Section. Dr. Li served as the VP for publications of IEEE Reliability Society in 2019, and has been the treasurer since 2020. He also served as a board member of IISE Quality Control and Reliability Engineering (QCRE) Division. He is an ASQ Certified Reliability Engineer and Caterpillar Six Sigma Black Belt. His research interests include data analytics, applied statistics, operations research, and reliability engineering. Dr. Li is a senior member of IEEE and IISE and was elected as the President of IEEE RS for 2022.
李钊军博士是西新英格兰大学工业工程与工程管理系教授。他目前是《IEEE Transactions on Reliability》的副主编以及《IEEE Access Reliability Society Section》的主编。李博士于2019年担任IEEE可靠性协会出版物副总裁，并自2020年起担任财务主管，还曾担任IISE质量控制和可靠性工程(QCRE)分会的董事会成员。李博士是经ASQ认证的可靠性工程师和卡特彼勒六西格玛黑带，他的研究兴趣主要包括数据分析、应用统计学、运筹学和可靠性工程。李博士是IEEE和IISE的高级成员，并当选为IEEE可靠性协会的2022年主席。
The development of complex engineering products faces many challenges such as meeting the development budget, release time, and performance goals. Most of the new product development processes have been experiencing challenges to meet these goals within an increasingly competitive global market environment. In addition, the reliability of the new product has always been a major concern for new product developers and it has been a difficulty to balance the development cost and time while increasing product reliability
The main goal of this research is to develop methodologies to support new product developers meet their product requirements and strategic business goals. This research consists of two main parts. In the first part, a novel methodology in modeling and optimizing the reliability growth is proposed, which considers the multiple stages of a new product development process and provides an optimal reliability growth plan in terms of time, cost, and the reliability of the newly developed products. The proposed approach differs from the existing research in the literature by, (1) considering multiple stages of the reliability growth program in the early stages of the new product development process, and (2) optimizing all three new product development goals simultaneously. The second part of this research provides an innovative approach to model and optimize the planning of a verification and validation (V&V) process in the early stages when designing a new product. This mathematical approach provides an optimal way of implementing a design verification and validation process to have maximum reliability improvement of a new product under development, when the implementation time and cost are limited.